Method and circuit for testing dc parameters of circuit input and output nodes
A Standard patent application filed on 03 April 2001 credited to Sunter, Stephen K.

Details

Application number :
2001248167  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Method and circuit for testing dc parameters of circuit input and output nodes  
Inventor :
Sunter, Stephen K.  
Agent name :
 
Address for service :
 
Filing date :
03 April 2001  
Associated companies :
 
Applicant name :
Logicvision, Inc.  
Applicant address :
 
Old name :
 
Original Source :
Go  

Same Inventor