Circuit and method for adding parametric test capability to digital boundary scan
A Standard patent application filed on 16 April 2003 credited to Sunter, Stephen K.

Details

Application number :
2003223620  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Circuit and method for adding parametric test capability to digital boundary scan  
Inventor :
Sunter, Stephen K.  
Agent name :
 
Address for service :
 
Filing date :
16 April 2003  
Associated companies :
 
Applicant name :
SUNTER, Stephen, K.  
Applicant address :
118 Arbeatha Street, Ottawa, Ontario K2H 6J2  
Old name :
 
Original Source :
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Same Inventor