Method and circuit for testing high frequency mixed signal circuits with low frequency signals
A Standard patent application filed on 19 April 2002 credited to Sunter, Stephen K.

Details

Application number :
2002307404  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Method and circuit for testing high frequency mixed signal circuits with low frequency signals  
Inventor :
Sunter, Stephen K.  
Agent name :
 
Address for service :
 
Filing date :
19 April 2002  
Associated companies :
 
Applicant name :
LOGICVISION, INC.  
Applicant address :
101 Metro Drive, Third Floor, San Jose, CA 95110  
Old name :
 
Original Source :
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Same Inventor