Method and apparatus for embeded built-in self-test (bist) of electronic circuits and systems
A Standard patent application filed on 12 November 2002 credited to Ricchetti, Michael ; Clark, Christopher J.

Details

Application number :
2002352644  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Method and apparatus for embeded built-in self-test (bist) of electronic circuits and systems  
Inventor :
Ricchetti, Michael ; Clark, Christopher J.  
Agent name :
 
Address for service :
 
Filing date :
12 November 2002  
Associated companies :
 
Applicant name :
INTELLITECH CORPORATION  
Applicant address :
70 Main Street, Durham, NH 03824  
Old name :
 
Original Source :
Go  

Same Inventor