Method and apparatus for optimized parallel testing and access of electronic circuits

Application number :: 2002315474
Application type :: Standard
Application status :: LAPSED
Under opposition :: No
Proceeding type :
Invention title :: Method and apparatus for optimized parallel testing and access of electronic circuits
Inventor :: Ricchetti, Michael ; Clark, Christopher J.
Agent name :
Address for service :
Filing date :: 27 June 2002
Associated companies :
Applicant name :: INTELLITECH CORPORATION
Applicant address :: 70 Main Street, Durham, NH 03824
Old name :
Original Source :: Go

Method and apparatus for optimized parallel testing and access of electronic circuits A Standard patent application filed on 27 June 2002 credited to Ricchetti, Michael ; Clark, Christopher J.