Polishing apparatus and methods controlling the polishing pressure as a function of the overlapping area between the polishing head and the semiconductor substrate
A Standard patent application filed on 22 August 2001 credited to Saldana, Miguel A.
;
Williams, Damon Vincent
Details
Application number :
2001285226
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Polishing apparatus and methods controlling the polishing pressure as a function of the overlapping area between the polishing head and the semiconductor substrate