A method and apparatus for scan testing dynamic circuits
A Standard patent application filed on 28 August 1998 credited to Gruner, Fred ; Parvathala, Praveen

Details

Application number :

90397  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

A method and apparatus for scan testing dynamic circuits  

Inventor :

Gruner, Fred ; Parvathala, Praveen  

Agent name :

 

Address for service :

 

Filing date :

28 August 1998  

Associated companies :

 

Applicant name :

Intel Corporation  

Applicant address :

 

Old name :

 

Original Source :

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