Method and apparatus for semiconductor wafer and lcd inspection using multidimensional image decomposition and synthesis
A Standard patent application filed on 01 July 1998 credited to Nelson, Larry A. ; Lee, Shih-Jong J

Details

Application number :
82805  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Method and apparatus for semiconductor wafer and lcd inspection using multidimensional image decomposition and synthesis  
Inventor :
Nelson, Larry A. ; Lee, Shih-Jong J  
Agent name :
 
Address for service :
 
Filing date :
01 July 1998  
Associated companies :
 
Applicant name :
NeoPath, Inc.  
Applicant address :
 
Old name :
 
Original Source :
Go  

Same Inventor