Device and method for testing integrated circuit dice in an integrated circuit module
A Standard patent application filed on 20 August 1997 credited to Farnworth, Warren M ; Duesman, Kevin G. ; Nelson, Eric S. ; Wark, James M.

Details

Application number :

40743  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Device and method for testing integrated circuit dice in an integrated circuit module  

Inventor :

Farnworth, Warren M ; Duesman, Kevin G. ; Nelson, Eric S. ; Wark, James M.  

Agent name :

 

Address for service :

 

Filing date :

20 August 1997  

Associated companies :

 

Applicant name :

Micron Technology, Inc.  

Applicant address :

 

Old name :

 

Original Source :

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