High accuracy calibration for 3d scanning and measuring systems
A Standard patent application filed on 02 July 1997 credited to Migdal, Alexander A.
;
Zhilyaev, Alexander
;
Petrov, Michael
;
Lebedev, Alexei
Details
Application number :
36524
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
High accuracy calibration for 3d scanning and measuring systems
Inventor :
Migdal, Alexander A.
;
Zhilyaev, Alexander
;
Petrov, Michael
;
Lebedev, Alexei