Refractometer and method for qualitative and quantitative measurements
A Standard patent application filed on 12 November 1999 credited to Byrne, Michael J. ; Ryan, Thomas E.

Details

Application number :

15245  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Refractometer and method for qualitative and quantitative measurements  

Inventor :

Byrne, Michael J. ; Ryan, Thomas E.  

Agent name :

 

Address for service :

 

Filing date :

12 November 1999  

Associated companies :

 

Applicant name :

Leica Microsystems Inc.  

Applicant address :

 

Old name :

 

Original Source :

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