Method of manufacturing a sensitive single-layer system for measuring the concentration of analytes and a system produced by this method
A Standard patent application filed on 24 May 1996 credited to Kirschner, Uwe ; Tamachkiarowa, Adriana ; Hannemann, Birgit ; Lau, Matthias

Details

Application number :

58909  

Application type :

Standard  

Application status :

CEASED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method of manufacturing a sensitive single-layer system for measuring the concentration of analytes and a system produced by this method  

Inventor :

Kirschner, Uwe ; Tamachkiarowa, Adriana ; Hannemann, Birgit ; Lau, Matthias  

Agent name :

Griffith Hack  

Address for service :

GPO Box 1285 MELBOURNE VIC 3001  

Filing date :

24 May 1996  

Associated companies :

 

Applicant name :

Kirschner, Uwe  

Applicant address :

Alttrachau 41 D-01139 Dresden Germany  

Old name :

 

Original Source :

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