Memory with stress circuitry for detecting defects
A Standard patent application filed on 16 June 1995 credited to Milstain, Yakov ; Rosen, Eitan

Details

Application number :

28651  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Memory with stress circuitry for detecting defects  

Inventor :

Milstain, Yakov ; Rosen, Eitan  

Agent name :

 

Address for service :

 

Filing date :

16 June 1995  

Associated companies :

 

Applicant name :

Intel Corporation  

Applicant address :

 

Old name :

 

Original Source :

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