Method for measuring the extent of skin aging and measurement kit
A Standard patent application filed on 30 November 1999 credited to Aman, Yoshikazu ; Yamashita, Ritsuo

Details

Application number :

14136  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Method for measuring the extent of skin aging and measurement kit  

Inventor :

Aman, Yoshikazu ; Yamashita, Ritsuo  

Agent name :

 

Address for service :

 

Filing date :

30 November 1999  

Associated companies :

 

Applicant name :

Sony Cp Laboratories Inc.  

Applicant address :

 

Old name :

 

Original Source :

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