Method and apparatus for wireless radio frequency testing of rfid integrated circuits
A Standard patent application filed on 03 November 1999 credited to Duan, Dah-Weih ; Brady, Michael John

Details

Application number :
13406  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Method and apparatus for wireless radio frequency testing of rfid integrated circuits  
Inventor :
Duan, Dah-Weih ; Brady, Michael John  
Agent name :
 
Address for service :
 
Filing date :
03 November 1999  
Associated companies :
 
Applicant name :
Intermec Ip Corp.  
Applicant address :
 
Old name :
 
Original Source :
Go  

Same Inventor