X-ray fluorescence sensor for measurement of metal sheet thickness
A Standard patent application filed on 10 August 2000 credited to Ghaziary, Hormoz ; Haszler, Alfred Johann Peter

Details

Application number :
64416  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
X-ray fluorescence sensor for measurement of metal sheet thickness  
Inventor :
Ghaziary, Hormoz ; Haszler, Alfred Johann Peter  
Agent name :
 
Address for service :
 
Filing date :
10 August 2000  
Associated companies :
 
Applicant name :
Corus Aluminium Walzprodukte GmbH  
Applicant address :
 
Old name :
 
Original Source :
Go  

Same Inventor