Sensing device and method for measuring emission time delay during irradiation of targeted samples
A Standard patent application filed on 02 December 1999 credited to Danielson, J. D. Sheldon
Details
Application number :
39960
Application type :
Standard
Application status :
SEALED
Under opposition :
No
Proceeding type :
Invention title :
Sensing device and method for measuring emission time delay during irradiation of targeted samples
Inventor :
Danielson, J. D. Sheldon
Agent name :
PHILLIPS ORMONDE FITZPATRICK
Address for service :
367 Collins Street MELBOURNE VIC 3000
Filing date :
02 December 1999
Associated companies :
Applicant name :
Photosense, L.L.C.
Applicant address :
Suite B, 1880 South Flatiron Court, Boulder, CO 80301 United States Of America