Interface independent test system
A Standard patent application filed on 03 March 2000 credited to Dearth, Glenn A. ; Zheng, Janet Y. ; Kaffine, David M. ; Plouffe, George R. Jr.

Details

Application number :

37165  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Interface independent test system  

Inventor :

Dearth, Glenn A. ; Zheng, Janet Y. ; Kaffine, David M. ; Plouffe, George R. Jr.  

Agent name :

 

Address for service :

 

Filing date :

03 March 2000  

Associated companies :

 

Applicant name :

Sun Microsystems, Inc.  

Applicant address :

 

Old name :

 

Original Source :

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