Instrument for testing specimen and instrument for wipe test
A Standard patent application filed on 17 April 2000 credited to Murakami, Seiji
;
Harada, Yasuhiro
Details
Application number :
36801
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Instrument for testing specimen and instrument for wipe test