Measuring device for the optical analysis of a test strip
A Standard patent application filed on 14 November 2003 credited to Ziegler, Friedrich ; List, Hans ; Kalveram, Stefan ; Asfour, Jean-Michel ; Haar, Hans-Peter

Details

Application number :

2003292018  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Measuring device for the optical analysis of a test strip  

Inventor :

Ziegler, Friedrich ; List, Hans ; Kalveram, Stefan ; Asfour, Jean-Michel ; Haar, Hans-Peter  

Agent name :

 

Address for service :

 

Filing date :

14 November 2003  

Associated companies :

 

Applicant name :

F.HOFFMANN-LA ROCHE AG  

Applicant address :

Grenzacherstrasse 124, CH-4070 Basel  

Old name :

 

Original Source :

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