Probe for testing flat panel display and manufacturing method thereof
A Standard patent application filed on 21 November 2003 credited to Jo, Byung-Ho ; Goo, Chul-Hwan ; Lee, Jung-Bae ; Jo, Yong-Hwi ; Lee, Oug-Ki ; Oh, Sung-Young ; Kim, Ki-Joon

Details

Application number :

2003282421  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Probe for testing flat panel display and manufacturing method thereof  

Inventor :

Jo, Byung-Ho ; Goo, Chul-Hwan ; Lee, Jung-Bae ; Jo, Yong-Hwi ; Lee, Oug-Ki ; Oh, Sung-Young ; Kim, Ki-Joon  

Agent name :

 

Address for service :

 

Filing date :

21 November 2003  

Associated companies :

 

Applicant name :

PHICOM CORPORATION  

Applicant address :

60-29, Gasan-dong, Kumchon-gu, 153-801 Seoul  

Old name :

 

Original Source :

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