Method for measuring contour variations
A Standard patent application filed on 12 September 2003 credited to Van Brug, Hedser
;
Korpershoek, Jacobus Johannes
;
Saunders, Ian
Details
Application number :
2003265007
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Method for measuring contour variations
Inventor :
Van Brug, Hedser
;
Korpershoek, Jacobus Johannes
;
Saunders, Ian
Agent name :
Address for service :
Filing date :
12 September 2003
Associated companies :
Applicant name :
NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO