Methods and systems for detecting components of plaque
A Standard patent application filed on 23 July 2003 credited to Leblanc, James Walter ; Hsieh, Jiang ; Wu, Xiaoye ; Edic, Peter Michael ; Avila, Ricardo Scott ; Iatrou, Maria

Details

Application number :

2003252103  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Methods and systems for detecting components of plaque  

Inventor :

Leblanc, James Walter ; Hsieh, Jiang ; Wu, Xiaoye ; Edic, Peter Michael ; Avila, Ricardo Scott ; Iatrou, Maria  

Agent name :

 

Address for service :

 

Filing date :

23 July 2003  

Associated companies :

 

Applicant name :

GE MEDICAL SYSTEMS GLOBAL TECHNOLOGY COMPANY, LLC  

Applicant address :

3000 North Grandview Boulevard, Waukesha, WI 53188  

Old name :

 

Original Source :

Go