Advanced chemical mechanical polishing system with smart endpoint detection
A Standard patent application filed on 17 January 2003 credited to Frey, Bernard M.
;
Mcgrath, Bret E.
;
Basol, Bulent M.
;
Young, Douglas
;
Wang, Yuchun
;
Talieh, Homayoun
;
Desai, Mukesh
;
Truong, Tuan
;
Velazquez, Efrain
Details
Application number :
2003248673
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Advanced chemical mechanical polishing system with smart endpoint detection
Inventor :
Frey, Bernard M.
;
Mcgrath, Bret E.
;
Basol, Bulent M.
;
Young, Douglas
;
Wang, Yuchun
;
Talieh, Homayoun
;
Desai, Mukesh
;
Truong, Tuan
;
Velazquez, Efrain