A method and system for estimating sharpness metrics based on local edge statistical distribution
A Standard patent application filed on 25 April 2003 credited to Gurbuz, Sabri ; Caviedes, Jorge E.

Details

Application number :

2003223054  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

A method and system for estimating sharpness metrics based on local edge statistical distribution  

Inventor :

Gurbuz, Sabri ; Caviedes, Jorge E.  

Agent name :

 

Address for service :

 

Filing date :

25 April 2003  

Associated companies :

 

Applicant name :

KONINKLIJKE PHILIPS ELECTRONICS N.V.  

Applicant address :

Groenewoudseweg 1, NL-5621 BA Eindhoven  

Old name :

 

Original Source :

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