Improved scanning probe microscope

Application number :: 2002356461
Application type :: Standard
Application status :: LAPSED
Under opposition :: No
Proceeding type :
Invention title :: Improved scanning probe microscope
Inventor :: Hong, Jae-Wan ; Park, Sang-Il ; Kwon, Joon-Hyung
Agent name :
Address for service :
Filing date :: 27 November 2002
Associated companies :
Applicant name :: PSIA CORPORATION
Applicant address :: 5F. Induspia, 517-13 Sang-Daewon-dong, Jungwon-gu, 462-120 Sungnam-shi
Old name :
Original Source :: Go

Improved scanning probe microscope A Standard patent application filed on 27 November 2002 credited to Hong, Jae-Wan ; Park, Sang-Il ; Kwon, Joon-Hyung