Non-destructive inspection device and non-destructive inspection method
A Standard patent application filed on 24 September 2002 credited to Kimura, Takashi ; Imamoto, Kazunobu

Details

Application number :
2002332269  
Application type :
Standard  
Application status :
LAPSED  
Under opposition :
No  
Proceeding type :
 
Invention title :
Non-destructive inspection device and non-destructive inspection method  
Inventor :
Kimura, Takashi ; Imamoto, Kazunobu  
Agent name :
 
Address for service :
 
Filing date :
24 September 2002  
Associated companies :
 
Applicant name :
MAGNEGRAPH CO., LTD.  
Applicant address :
2-62, Kaminagare-cho, Nakagawa-ku, Nagoya-shi, Aichi 454-0846  
Old name :
 
Original Source :
Go  

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