Integrated semiconductor component for conducting high-frequency measurements and the use thereof
A Standard patent application filed on 16 August 2002 credited to Schmidt, Ewald
;
Hasch, Juergen
;
Pfizenmaier, Heinz
;
Irion, Hans
Details
Application number :
2002320950
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Integrated semiconductor component for conducting high-frequency measurements and the use thereof