Single event upset (seu) hardened static random access memory cell
A Standard patent application filed on 17 November 1999 credited to Phan, Ho Gia ; Hoffman, Joseph ; Li, Bin ; Jallice, Derwin

Details

Application number :

21518  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Single event upset (seu) hardened static random access memory cell  

Inventor :

Phan, Ho Gia ; Hoffman, Joseph ; Li, Bin ; Jallice, Derwin  

Agent name :

 

Address for service :

 

Filing date :

17 November 1999  

Associated companies :

 

Applicant name :

Lockheed Martin Corporation  

Applicant address :

 

Old name :

 

Original Source :

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• Method and apparatus for hardening a static random access memory...