Apparatus and method for conductivity measurement including probe contamination compensation
A Standard patent application filed on 23 April 2002 credited to Cocking, Andrew J. ; Chan, Wai Yin Cedric ; Livingston, James W.

Details

Application number :

2002254727  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Apparatus and method for conductivity measurement including probe contamination compensation  

Inventor :

Cocking, Andrew J. ; Chan, Wai Yin Cedric ; Livingston, James W.  

Agent name :

 

Address for service :

 

Filing date :

23 April 2002  

Associated companies :

 

Applicant name :

DIVERSEYLEVER, INC.  

Applicant address :

2841 Mission Street, Santa Cruz, CA 95060-2142  

Old name :

 

Original Source :

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