A multiple-capture dft system for scan-based integrated circuits
A Standard patent application filed on 22 March 2002 credited to Hsu, Chi-Chan ; Hsu, Fei-Sheng ; Wang, Hsin-Po ; Wen, Xiaoqing ; Lin, Meng-Chyi ; Kao, Shih-Chia ; Wang, Laung-Terng

Details

Application number :

2002250226  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

A multiple-capture dft system for scan-based integrated circuits  

Inventor :

Hsu, Chi-Chan ; Hsu, Fei-Sheng ; Wang, Hsin-Po ; Wen, Xiaoqing ; Lin, Meng-Chyi ; Kao, Shih-Chia ; Wang, Laung-Terng  

Agent name :

 

Address for service :

 

Filing date :

22 March 2002  

Associated companies :

 

Applicant name :

SYNTEST TECHNOLOGIES, INC.  

Applicant address :

505 S. Pastoria Avenue, Suite 101, Sunnyvale, CA 94086  

Old name :

 

Original Source :

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