Extraction method of defect density and size distributions
A Standard patent application filed on 12 March 2002 credited to Stine, Brian E.
;
Hess, Christopher
;
Burch, Richard
;
Ciplickas, Denis J.
;
Weiland, Larg H.
;
Stashower, David
Details
Application number :
2002247317
Application type :
Standard
Application status :
LAPSED
Under opposition :
No
Proceeding type :
Invention title :
Extraction method of defect density and size distributions
Inventor :
Stine, Brian E.
;
Hess, Christopher
;
Burch, Richard
;
Ciplickas, Denis J.
;
Weiland, Larg H.
;
Stashower, David
Agent name :
Address for service :
Filing date :
12 March 2002
Associated companies :
Applicant name :
PDF SOLUTIONS, INC.
Applicant address :
Suite 700, 333 West San Carlos Street, San Jose, CA 95110