Time-frequency domain reflectometry apparatus and method
A Standard patent application filed on 07 July 2003 credited to Powers, Edward J. ; Song, Eun-Seok ; Park, Jin-Bae ; Shin, Yong-June ; Kim, Joo-Won ; Sung, Seung-Hoon ; Choe, Tok-Son ; Yook, Jong-Gwan

Details

Application number :

2003246108  

Application type :

Standard  

Application status :

LAPSED  

Under opposition :

No  

Proceeding type :

 

Invention title :

Time-frequency domain reflectometry apparatus and method  

Inventor :

Powers, Edward J. ; Song, Eun-Seok ; Park, Jin-Bae ; Shin, Yong-June ; Kim, Joo-Won ; Sung, Seung-Hoon ; Choe, Tok-Son ; Yook, Jong-Gwan  

Agent name :

 

Address for service :

 

Filing date :

07 July 2003  

Associated companies :

 

Applicant name :

SHIN, Yong-June  

Applicant address :

2-907, Daegyo Apts., Yeouido-dong, Yeongdeungpo-gu, Seoul 150-010  

Old name :

 

Original Source :

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